Our Microscopy & Materialography

  • SEI/BEI- recordings; crystallographic orientation contrasts

  • EDS: spot analysis, hypermapping, Linescan, particle analysis

  • Determining calorific value of liquid and solid samples

  • Production accompanied analytics

  • Research accompanied analytics

  • Examination of complaints
Bild

Our Methods

Characteristics

Methods of Analysis

Equipment

quantitative and qualitative analysis

scanning electron microscopy (EDX)

JSM-6490LV, Quantax 400

quantitative and qualitative analysis

scanning electron microscopy

Jeol JSM-6700 F,

JSM-6490LV

microscopy, pore measurement, metallographic specimen preparation

metallography


calorific value

calorimetry

IKA

combustion class, dust explosion hazard, burning rate, relative autoignition temperature


Hartmann


Further information can be found in our Portfolio of Services


Our Equipment

Device

Type (Manufacturer)

Scanning Electron Microscope

JSM-6490LV

Cross section polisher

CSP IB-09010CP (Jeol)

Field Emission

Scanning Electron Microscope

JSM-6700 F (Jeol)

Calorimeter

C200 (IKA)

Evaporating

Leica

Buffing machine

Phoenix 4000 (Buehler)

Light microscope

Polyvar, Stereo microscope (Wild)

Sputtercoater

SCD 500 (Leica)