Microscopy & Materialography

Service supports customers’ R&D activity based on analytical expertise of ChemiLytics’ team and its highly specialized equipment (e.g. Scanning Electron Microscopy). Another area offers specific root-cause analysis to derive the reasons for complaints.


Overview

  • SEI/BEI- recordings; crystallographic orientation contrasts

  • EDS: spot analysis, hypermapping, Linescan, particle analysis

  • Production accompanied analytics

  • Research accompanied analytics

  • Quantitative & qualitative Analysis (Examination of complaints, contamination,...)


Equipment-Highlights

1
Scanning Electron Microscope (JSM-6490LV Jeol))
2
Field Emission Scanning Electron Microscope (JSM 6700 F (Jeol))
3
Energy dispersive X Ray (EDX Quantax 400 (Bruker))
4
Light microscope (Polyvar, Stereomikroskop (Wild))
5
Buffing machine (Phoenix 4000 (Buehler))
6
Vibration Buffing Machine (VibroMet 2 (Buehler))
7
Cross Section Polisher (CSP IB-09010CP (Jeol))
8
Sputtercoater (SCD 500 (Leica))
9
Calorimeter (C 200 (IKA) - Brennwertbestimmung))
10
Density (He-Pyknometer AccuPyc II 1340 (Micromeritics))

Impressions

HGP 1930
HGP 4401